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Differential Amplifiers - Analog Electronics - Lecture Slides, Slides of Computer Science

These are the Lecture Slides of Analog Electronics which includes Analog Electronics, Input Resistance, Analog Modulators, Logic Gates, Frequency Amplifiers, Device Parameter Tracking, Bias Stability, Stabilizing Neg Feedback Resistor etc. Key important points are: Differential Amplifiers, Analog Electronics, Input Resistance, Analog Modulators, Logic Gates, Frequency Amplifiers, Device Parameter Tracking, Bias Stability, Stabilizing Neg Feedback Resistor

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2012/2013

Uploaded on 03/21/2013

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Differential Amplifiers (Chapter 8
Differential amplifiers are pervasive in analog electronics
Low frequency amplifiers
High frequency amplifiers
Operational amplifiers – the first stage is a differential amplifier
Analog modulators
Logic gates
Advantages
Large input resistance
High gain
Differential input
Good bias stability
Excellent device parameter tracking in IC implementation
Examples
Bipolar 741 op-amp (mature, well-practiced, cheap)
CMOS or BiCMOS op-amp designs (more recent, popular)
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Differential Amplifiers (Chapter 8

  • Differential amplifiers are pervasive in analog electronics
    • Low frequency amplifiers
    • High frequency amplifiers
    • Operational amplifiers – the first stage is a differential amplifier
    • Analog modulators
    • Logic gates
  • Advantages
    • Large input resistance
    • High gain
    • Differential input
    • Good bias stability
    • Excellent device parameter tracking in IC implementation
  • Examples
    • Bipolar 741 op-amp (mature, well-practiced, cheap)
    • CMOS or BiCMOS op-amp designs (more recent, popular)

Amplifier With Bias Stabilizing Neg Feedback Resistor

  • Single transistor common-emitter or common-source amplifiers often use a bias

stabilizing resistor in the common node leg (to ground) as shown below

  • Such a resistor provides negative feedback to stabilize dc bias
  • But, the negative feedback also reduces gain accordingly
  • We can shunt the common node bias resistor with a capacitor to reduce the negative

impact on gain

  • Has no effect on gain reduction at low frequencies, however
  • Large bypass capacitors are difficult to implement in IC design due to large area
  • Conclusion: try to avoid using feedback resistor R2 in biasing network

Differential Amplifier with Two Simultaneous Inputs

  • The differential amplifier topology shown at

the left contains two inputs, two active

devices, and two loads, along with a dc

current source

  • We will define the
    • differential mode of the input v (^) i,dm = v 1 – v (^2)
    • common mode of the input as v (^) i,cm= ½ (v 1 +v 2 )
  • Using these definitions, the inputs v 1 and v (^2)

can be written as linear combinations of the

differential and common modes

  • v 1 = v (^) i,cm + ½ v (^) i,dm
  • v 2 = v (^) i,cm – ½ v (^) i,dm
  • These definitions can also be applied to the

output voltages

  • Differential mode v (^) o,dm = v (^) o1 – v (^) o
  • Common mode v (^) o,cm = ½ (v (^) o1 + v (^) o2)
  • Alternately, these can be written as
  • v (^) o1 = v (^) o,cm + ½ v (^) o,dm
  • v (^) o2 = v (^) o,cm – ½ v (^) o,dm

Bipolar Transistor Differential Amplifier

  • Q1 & Q2 are matched (identical) NPN

transistors

  • Rc is the load resistor
    • Placed on both sides for symmetry, but could be used to obtain differential outputs
  • I (^) o is the bias current
    • Usually built out of NPN transistor and current mirror network
    • r (^) n is the equivalent Norton output resistance of the current source transistor
  • Input signal is switching around ground
  • V (^) ref = 0 for this particular design
    • Both sides are DC-biased at ground on the base of Q1 and Q
  • vBE is the forward base-emitter voltage across

the junctions of the active devices

  • Since Q1 and Q2 are assumed matched, Io

splits evenly to both sides

  • I (^) C1 = I (^) C2 = Io /

Bipolar Transistor Operation (1D Device)

BJT operation:

  • An external voltage (0.75-0.85 V) is applied

to forward-bias the emitter-base junction

  • Electrons are injected from the emitter into

the base comprising the majority of the

emitter current

  • Holes are injected from the base into the emitter, as well, but their numbers are much smaller, since N (^) D,e >> N (^) A,b
  • Since X (^) B << Ln in the base, most of the

injected electrons get to the collector

without recombining with holes. Any holes

that do recombine with electrons in the base

are supplied as base current.

  • Electrons reaching the collector are collected

across the base-collector depletion region.

  • Since most of the injected electrons reach

the collector and only a few holes are

injected into the emitter, or recombine with

electrons in the base, I B << I C, implying that

the device has a large current gain.

  • Shown at left are the effects of

different NPN bias conditions

on the energy bands and the

electron concentrations:

(a) No bias (thermal equilibrium)

  • Fermi levels are flat
  • Electron concentration is N (^) D in emitter and collector and n (^) i^2 /N (^) A in the base

(b) both junctions reverse biased

  • Increased E-B & B-C barriers
  • Increase in depletion regions
  • Electron density in base = ~

(c) both junctions forward biased

  • Reduced barrier heights
  • Electrons injected into base from both emitter and collector

(d) forward-biased emitter, reverse-

biased collector

  • Small E-B/large C-B barriers
  • Electrons injected from emitter
  • Electron density = ~ 0 at C-B junction and appears linear in base region (small W (^) B )

Ebers-Moll BJT DC Model Current Equations

  • The Ebers-Moll model may be used under all junction bias conditions (i.e., forward-

active, inverse, saturation, and cut-off) to estimate the terminal currents.

Bipolar Transistor Collector Characteristics

  • Shown below is a set of BJT (bipolar junction transistor) collector characteristics
    • I (^) C versus V (^) CE with IB as the parameter
  • The curves have several regions of operation
    • At low V (^) CE both the emitter-base junction and the collector-base junction are forward-biased, resulting in what is called saturation in the bipolar transistor - The base volume is flooded with mobile carriers injected from both E-B and C-B junctions
    • At higher (normal) V (^) CE only the emitter-base junction is forward-biased, while the collector- base junction is reverse-biased, resulting in the normal active (forward mode) region - The carrier concentration is pinned at zero (i.e. very small) at the collector junction, resulting in a linear (triangular) distribution of charge in the base - Non-zero slope in normal active region is caused by base width narrowing due to increase in V (^) CB reverse bias and corresponding increase in C-B depletion region ( Early Effect named after Jim Early)
    • At even higher V (^) CE the transistor enters the onset of avalanche breakdown at the CB junction

The non-zero slope in the forward mode region is modeled, as shown below, with a linear term V (^) CE /VA , where VA is the Early Voltage.

Definitions of fT and fmax

  • Cuttoff frequency f (^) T can be defined as a series of time constants including base storage

time τb, emitter storage time τe , collector storage time τc , and several RC time constants

due to emitter and collector depletion capacitances and collector-to-substrate capacitance

IBM SiGe Design Kit Training: Technology, IBMMicroelectronics, Burlington, VT, July 2002

  • Normally the dominant

terms in order of

significance are the

base storage time τb,

emitter storage time τe ,

and the depletion

charge terms

(kT/qIc)(Cje + Cjc)

  • For IBM SiGe NPN

technology the last

several terms are

usually negligible since

Re, Rc, and R ns are

small

SiGe NPN Bipolar β and fT versus Current

  • Plotted at left are the current gain β and f (^) T

versus collector current for two different

emitter width NPN transistors

  • Both β and fT drop off at high current density due to base push-out (called the Kirk Effect ) - When the number of injected electrons exceeds the N type doping of the collector region, the base-collector space charge region pushes all the way to the heavily-doped N+ subcollector. - The use of a self-aligned collector pedestal N implant raises the doping in the intrinsic portion of the collector N epi and prevents base push-out until very high current (<1 mA/um2) - Use of a self-aligned pedestal implant limits the increase in Ccb due to the higher collector doping (which is only in the intrinsic portion of the device)
  • The two curves in the plots are shifted by the area of the emitter. - Using minimum width for the emitter improves base resistance and therefore improves device performance.

Harame, et al., IEEE Trans ED,Vol. 48, No. 11, Nov. 2001

BJT SPICE Model Parameters

  • Typical SPICE circuit model parameters for a vintage 1 um silicon bipolar technology are

given below (from Johns and Martin, Analog Integrated Circuit Design , 1997, p. 65)

  • The f (^) T would be about 13 GHz, based on the forward base transit time τF of 12 ps
  • Reverse current gain-bandwidth product would be about 40 MHz based on τR of 4 ns
  • Rb of 500 ohms and C (^) cb of 18 fF suggest a relatively low f (^) max of about 7-8 GHz f (^) max = [f (^) T / 8 π RbCcb] ½

Small-Signal Model Analysis for Single Input Diff Amp

  • Consider transistor Q2 with grounded base
    • dc small-signal model shown in top-left figure
    • Use the test voltage approach to calculate Q2’s input impedance looking into emitter
    • Using KCL equations, we can write itest = v (^) test/rπ – βoib2 where ib2 = - v (^) test/rπ
    • Rearranging and solving for v (^) test/itest, we have r (^) th2 = v (^) test/itest = r π /( β o + 1) = ~ r π / β o = 1/g (^) m
    • Generally g (^) m2 is large, causing rth2 to act like an ac short
  • Consider transistor Q1 with Q2 replaced by r (^) th
    • Since r (^) th2 is much smaller than r (^) n (output impedance of Io), we will neglect rn
    • Writing KCL, we have v (^) in = ib1 rπ 1 + i (^) b1 (βo + 1) r (^) th2 = i (^) b12 rπ 1
    • where we assumed rπ 1 = rπ 2
    • We can now find vout as a function of vin v (^) out = - ic1Rc = - βoib Rc = - βov (^) in Rc/2rπ 1 = - ½ g (^) mRcv (^) in
    • where we have used g (^) m = βo/rπ 1
  • Small signal gain A (^) v = vout /vin = - ½ gm R (^) c

Bipolar Diff Amp with Differential Inputs (continued)

  • Solving for the output voltages we can obtain
    • v (^) o1 = -ic1RC = - βoib1RC = - (βo /rπ)v (^) a(t)R (^) C and v 02 = + (βo /rπ)v (^) a(t)R (^) C
  • We can now find the gain with differential-mode input and single-ended output or with

differential-mode input and differential output

A (^) dm-se1 = v 01 /v (^) idm = -g (^) mR (^) C /2 and A (^) dm-se2 = + g (^) mR (^) C / A (^) dm-diff = (v 01 – v 02 )/ v (^) idm = - g (^) mR (^) C

  • Since corresponding currents on the left and right side of the differential small-signal

model are always equal and opposite, implying that no current ever flows throw r n

  • Node E acts as a “ virtual ground
  • If the output resistances of Q1 and Q2 are low enough to require keeping them in the

analysis, we simply replace R C with the parallel combination of RC||r o for transistor Q

and Q

Small-Signal Model of BJT Diff Amp with CM Inputs

  • The figure below is the small-signal model for the diff amp with common-mode inputs
    • v1 = v2 = v (^) b(t) and v (^) icm = ½ (v1 + v2) = v (^) b(t)
  • The common-mode currents from both inputs flow through rn as shown by the two loops
    • in = 2(βo + 1) i (^) b1 = 2 (βo + 1) i (^) b
    • and therefore, v (^) b = i (^) brπ + 2(βo+ 1)i (^) br (^) n or ib = v (^) b/[rπ + 2(βo+ 1)r (^) n ]
  • The collector voltages can be found as
    • v 01 = v 02 = - βoRC v (^) b/[rπ + 2(βo+ 1)r (^) n ] = ~ - g (^) mRC v (^) b/ [1 + 2g (^) mr (^) n]
  • The common-mode gain with single-ended output is given by
    • A (^) cm-se1 = A (^) cm-se2 = v (^) o1/v (^) icm = v (^) o2 /v (^) icm = - g (^) mR (^) C /[1 + 2g (^) mr (^) n ] = ~ -R (^) C /2r (^) n
  • The common-mode gain with differential output is A (^) cm-diff = (v (^) o1 – vo2)/vicm = 0
  • Do Example 8.1, p. 488