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The properties of electromagnetic waves and their interference patterns, focusing on the interference of waves in thin films. Topics include the behavior of electric fields, trigonometric identities, and intensity maxima in young's double slit experiment.
Typology: Slides
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Webassign
hint:
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Another
example
in
your
text):
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From
previous
lecture:
Diverging
lens:
Converging
lens:
virtual
image
of
face
smaller
virtual
image
of
face
larger
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2
cos
1 2
π 2 λ
sin
2
π 2 λ
sin
π 2 λ
sin
) , (
)
(continued
ion
Superposit
max
max
max
vt
x
E
vt
x
E
vt
x
E
t x
E
tot y
2
cos
2
sin 4
)
sin(
)
sin( :
magnitude
Squared
2
cos
2
sin 2
)
sin(
)
sin(
:
identity
tric
trigonome
the
from
follows
result
that this
Note
2
2
2
B A B A B A
B A B A B A
2
cos
4
2
cos
2
4
2
1
:
waves
EM
the
of
Intensity
2
1
2
max
0
2
2
max
0
1
I
E
c
I
I
E
c
S
I
tot
avg
Time
average
Constant
in
time
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Example:
=0.
rad
‐‐
plotting
snapshot
of
EM
wave
Example:
=
rad
plotting
snapshot
of
EM
wave
Intensity
as
a
function
of
:
/(
)
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Two
examples
of
superposed
radiation:
Interference
from
refraction
and
reflection
of
thin
films
Young’s
double
slit
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λ
θ
sin
π
λ
π
2
1
m
d
m
r
r
λ
π
cos
π 2
λ
π
sin
π 2
π^ λ 2
sin
π 2
π^ λ 2
sin
2
1
2
1
max
2
max
1
max
r
r
ft
r
r
ft
r
ft
r
t
P
E
θ
sin
δ
2
1
d
r
r
intensity
maxima
occur
for
Young’s
double
slit
geometry:
Mathematical
analysis
of
bright
fringes:
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λ
θ
sin
π
λ
π
2
1
m
d
m
r
r
Diffraction
pattern
from
a
plane
wave
incident
on
a
double
slit:
λ
π
cos
π 2
λ
π
sin
π 2
π^ λ 2
sin
π 2
π^ λ 2
sin
2
1
2
1
max
2
max
1
max
r
r
ft
r
r
ft
r
ft
r
t
P
E
θ
sin
δ
2
1
d
r
r
intensity
maxima
occur
for
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Summary
of
results:
D^ d
m
y
m
d
λ
screen
on
Image
λ
θ
sin
ce
interferen
ve
Constructi
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Interference
between
reflected
waves:
Recall
‐‐
the
behavior
of
a
plane
‐polarized
electromagnetic
wave
near
the
surface
of
two
materials:
k
1 E
1
B
1
k
k
2
t
t
1
1
max
1
1
1
max
1
ω
sin
ω
sin 1 1
r
k
r
k
t
2
2
max
2
ω
sin 2
r
k
2
(^22) ω
v
k
1
(^11)
(^11)
ω
ω
v
k
k
Periodic
waves:
E
’^1
E
2
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k
1 E
1
B
1
k
k E ’^2
1
E
2
Matching
electric
and
magnetic
fields
at
boundary:
n
1 n
2
2
2
1
1
2
2
1
1
max
max
θ
cos
θ
cos
θ
cos
θ
cos
1
1
n
n
n
n
2
1
1
2
2
1
1
2
max
max
θ
cos
θ
cos
θ
cos
θ
cos
1
1
n
n
n
n
or
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Multiple
refractions
and
reflections
in
a
thin
film
^
^
^
^
^
^
^
2
1
2
av
2
1
max
(^22)
max
(^11)
max
λ π
cos^ sin
π 2
λ π
sin cos
2
π 2
π 2 λ
sin
π 2
π λ 2
sin
) , (
r
r
ft
r
r
E
ft
r
E
ft
r
E
t P E
t
r
r
1
2
P
^
^
^
λ
2
at
min
λ
2
at
max
(^2) λ π
sin
;
For
12
2
max
max
1
2
1
1
m
nt
m
nt
t
E
E
n
n
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Example
of
interference
with
“+”
n
1 n
2 n
3
2
1 2
max
cos
peaks
at
π
λ
π
1
2
1 2
m
r
r
n
1
<
n
< 2
n
3
For
each
surface
with
n
< 1
n
2
E
2
=
‐
E
1
for
reflected
beam
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